ELES has developed specific solutions for Design, Qualification and Manufacturing of MEMORIES, Full Digital or Mixed Signal SOC (Systems On Chip), ADAS (Advanced Driver-Assistance Systems), u-EMBEDDED MEMORY, SMART POWER, SMART LEDS and MEMS (Micro Electrical-Mechanical Systems). Thanks to RETE approach and the possibility of achieving the target of Zero Defects, ELES solutions and services are mostly used in markets such as automotive, avionics, aerospace and defence, where semiconductors reliability is fundamental for safety.However, the innovation brought by ELES with RETE is also applied in more price sensitive sectors such as industrial, communications and IOT where design and process improvement generated by RETE allow sensible cost reductions.A major source of errors in modern integrated circuits are intermittent faults. The root cause for these faults ranges from manufacturing residuals to oxide breakdown. Intermittent faults may or may not always induce an error depending on some environmental conditions, but when it does, it occurs in the same location due to unstable or marginal hardware. Their occurrence is expected to increase because of the higher circuit complexity and the aggressive scaling of semiconductor devices. In the traditional reliability flow, defective devices are identified doing parametric and functional measurements on ATE machines before and after having stressed the device. Failures which are intermittent are not identified, as they tend to remain activated so long as the stress conditions are present.