ARTgp

Universal Reliability Test System

for Low Power SOC, MEMS, MEMORIES ICS | UP TO 5W

RETE Test Platform

Massive Parallel Stress and Test approach up to 12k ICs per System (2 Oven Configuration)

Thermal Chamber with Air Cooling Technology. High Temperature Uniformity: ±3°C at full load.

Automation Ready System for integration in Production Plants.

HTOL LTOL HTRB ELFR TDBI – Trials