ARThph

Reliability Test System

for High Power DENSITY GPUs, IPUs, AI AND COMMUNICATION PROCESSORS | MORE THAN 1500W

RETE Test Platform

Two phases liquid cooling technology for very high power density > 150W/cm2

Per Device Active Temperature Control within ±3°C

Hot-spots thermal management for Multi die systems

Fast reaction to prevent thermal run away and accurate thermal control ±3°C

In-situ test capabilities and extended data collection to enable effective learning from fail

Adaptive stress based on real-time calculation of DUT equivalent lifetime, to guarantee the target mission profile for each DUT

HTOL ELFR TDBI – Trials