Engineering Station and IDE for easy and
Fast Test Program development and post Silicon Validation
ART520
ART TST
Universal and Adaptive Reliability Testing Platform
Enabling Stress and Test in the same insertion - TfR
(Test for Reliability) approach
Configurable by HW Kits and SW libraries to manage different IC families:
low/high power SOC, Memories, MEMs, smART Power...
Management of External Test/stress Instruments
(on Fixture BoST IPs) to extend test and stress capabilities
for the specific IC families.
Scalable to approach engineering, Reliability and Production tests
with the same platform, development and test environment
Flexible and extensive Datalogging, fully integrated with Data Analytics Tools:
STDF, SQL_Lite, ...
Test Program based on standard templates - C/C++ Programming Language
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