ARThp

Universal Reliability Test System

for High Power ICS | UP TO 100W

RETE Test Platform

Massive Parallel Stress and Test approach up to 288 ICs per System (2 Oven Configuration - 100W ICs)

In situ test capabilites with on board Test IPs

Per Device Active Temperature Control combined with Local Air Cooling Technology

High Temperature accuracy on device case/junction temperature: ±3°C

HTOL LTOL ELFR TDBI – Trials