for High-Power SOC Devices |
UP TO 400W
Combined Accelerated stress and in-situ test
High Parallelism Production Tester for High-Power SOC Devices, up to 400W
(i.e. ADAS, Networking, Cloud Computing, AI).
Ready for Fully automated Tray-In Tray-out Test Cell
Best-in-Class Solution in COO - Cost of Ownership - based on ELES Proprietary Liquid Cooling Matrix
Configurable with different Matrix models vs IC Power / Package
High System Capacity by High Test Fixture parallelism
(3D Fixture to optimize density)
High precision per DUT Active Temperature Control (±3°C)
enabling effective HV Fast Stress also on high Power Devices.
Enhanced Fault Triggering and Detection towards Zero Defect production
with RETE Test for Reliabilty approach.
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