ScientificPapers And Publications

Scientific Papers & Publications

At ELES, research and innovation drive the continuous evolution of semiconductor testing and reliability.

Through R&D activities and collaborations with universities, research institutes and technology partners, ELES contributes to the development of advanced methodologies in semiconductor reliability, Test for Reliability, data analytics, AI and device monitoring.

Explore our scientific papers, technical publications and contributions presented at leading international conferences and industry events.

Dynamic Deployment of Real Time Services in Edge Computing Systems

IEEE Open Journal of the Communications Society — 2026

Reliability Embedded Test Engineering (RETE)

ETTC2026 ELES & Fraunhofer ENAS

AI POWERED RELIABILITY – RETE Project for Semiconductor excellence 2025

41Tth CHEMNITZ SEMINARS FRAUNHOFER 2025

A 125 kHz Self-Oscillating Inverter for Inductive Power Transfer Applications With Power MOSFET In-Circuit Self-Test

IEEE Wireless Power Technology Conference and Expo

In-chip Monitoring for Extended Reliability Testing and Mission Profile Monitoring Feedback Loop

29th IEEE European Test Symposium (ETS) — 2024

RETE: Design and Test for Reliability – Data Analysis for Zero Defects

IEEE International Test Conference / ARTs

Using Deep Data Analytics to Enhance Reliability Testing

The fast roadmap for Zero Defects by proteanTecs & ELES
ELES & proteanTecs — White Paper

Meeting the Reliability Semiconductor Needs of the Future in Testability, Functional Safety and Security

TestConX China — 2020

Scientific Papers & Publications