ARTmp

Universal Reliability Test System

for Medium Power ICS | UP TO 20W

RETE Test Platform

Massive Parallel Stress and Test approach up to 1k, PTC ICs per System (2 Oven Configuration - 20W ICs)

Per Device Active Temperature Control combined with Air Cooling thermal Chamber Technology

High Temperature accuracy on device case/junction temperature: ±3°C

Automation Ready System for integration in Production Plants

HTOL LTOL ELFR TDBI – Trials