POWER
from 0W to >3000W
Zero Defect & Zero Scraps
Shorter Time to Market
COO minimization
UNIVERSAL Test Platform
Industry 4.0 readiness
Competitivity
Sustainability
to combine stress and test in the same insertion.
to manage different IC families: low/high power SOC, Memories, MEMs, smART Power...
(on Fixture BOST IPs) to extend test and stress capabilities for the specific IC family.
with the same platform, development and test environment.
Universal Reliability Test System for low power SOC, MEMS, memories ICS
Reliability Test System for medium power ICS
Reliability Test System for high power ICS
Reliability Test System for high power density GPUs, IPUs, AI and communication processors
