ART 520 LOGICO

  • Universal Testing Platform.
  • TfR tester to combine stress and test in the same insertion.
  • Configurable by HW Kits and SW libraries to manage different IC families: low/high power SOC, Memories, MEMs, smART Power…
  • Management of External Test/stress Instruments (on Fixture BOST IPs) to extend test and stress capabilities for the specific IC family.
  • Scalable to approach engineering, Reliability and Production tests with the same platform, development and test environment

TIPO DI CAMERA: M12 (-40+150) - TTS1E (-40+175)
  • ELES services to optimize fixture cost, performances and reliability.
  • Qualified components libraries and application of consolidated Design for Manufacturing rules.
  • Standard and reusable mother boards with development of appliction specific IP.
  • Fixture Robustness optimized for extreme conditions and continuos handling.
  • Signal and Power Integrity simulation / optimization service to guarantee and optimize electrical perfomance versus test application specs.
  • Thermal Head design and simulation service to optimize thermal performance and cost by design phase.
TIPO DI PROVE: HTOL - HTRB - LTOL - ELFR