Q&R

Quality & Reliability

ART 520 LOGICO

  • Universal Testing Platform.
  • TfR tester to combine stress and test in the same insertion.
  • Configurable by HW Kits and SW libraries to manage different IC families: low/high power SOC, Memories, MEMs, smART Power…
  • Management of External Test/stress Instruments (on Fixture BOST IPs) to extend test and stress capabilities for the specific IC family.
  • Scalable to approach engineering, Reliability and Production tests with the same platform, development and test environment